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Topography stitching in the spatial frequency domain for the representation of mid-spatial frequency errors

Sekman, Y; Trost, M; Lammers, T; Hartung, J; Risse, S; Schroder, S

Sekman, Y (通讯作者)，Fraunhofer Inst Appl Opt & Precis Engn IOF, Ctr Excellence Photon, Albert Einstein Str 7, D-07745 Jena, Germany.;Sekman, Y (通讯作者)，Friedrich Schiller Univ Jena, Inst Appl Phys, Abbe Centerof Photon, Albert Einstein Str 15, D-07745 Jena, Germany.

APPLIED OPTICS, 2022; 61 (28): 8286

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