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Band gap determination in multi-band-gap CuFeO2 delafossite epitaxial thin film by photoconductivity

Vojkovic, S; Fernandez, J; Elgueta, S; Vega, FE; Rojas, SD; Wheatley, RA; Seifert, B; Wallentowitz, S; Cabrera, AL

Cabrera, AL (reprint author), Pontificia Univ Catolica Chile, Inst Fis, Av Vicuna Mackenna 4860, Santiago, Chile.

SN APPLIED SCIENCES, 2019; 1 (11):

Abstract

The photoconductivity within a wavelength range of 450-1100 nm was determined for a sample of epitaxial delafossite CuFeO2 film grown by pulsed laser ......

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