Cost and Capability Compromises in STEM Instrumentation for Low-Voltage Imaging-MedSci.cn - 梅斯（MedSci）

Cost and Capability Compromises in STEM Instrumentation for Low-Voltage Imaging

Quigley, F; McBean, P; O'Donovan, P; Peters, JJP; Jones, L

Quigley, F (通讯作者)，Trinity Coll Dublin, Sch Phys, Dublin 2, Ireland.;Quigley, F (通讯作者)，Ctr Res Adapt Nanostruct & Nanodevices CRANN, Adv Microscopy Lab, Dublin 2, Ireland.

MICROSCOPY AND MICROANALYSIS, 2022; 28 (4): 1437

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