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Effect of Total Ionizing Dose Damage on 8-Transistor CMOS Star Sensor Performance

Feng, J; Li, YD; Fu, J; Wen, L; He, CF; Guo, Q

Feng, J (corresponding author), Xin Jiang Tech Inst Phys & Chem, Urumqi 830011, Peoples R China.; Feng, J (corresponding author), Xinjiang Key Lab Elect Informat Mat & Device, Urumqi 830011, Peoples R China.

SEMICONDUCTORS, 2021; 55 (1): 108

Abstract

The effects of total ionizing dose (TID) radiation from Co-60 gamma-rays on an 8-transistor global shutter exposure complementary metal-oxide semicond......

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