Abstract
Tu, FB; Wu, WW; Wang, Y; Chen, HJ; Xiong, F; Shi, M; Li, N; Deng, JY; Chen, TB; Liu, LB; Wei, SJ; Xie, Y; Yin, SY
Yin, SY (corresponding author), Tsinghua Univ, Inst Microelect, Beijing 100084, Peoples R China.; Yin, SY (corresponding author), Tsinghua Univ, Beijing Innovat Ctr Future Chip, Beijing 100084, Peoples R China.; Yin, SY (corresponding author), Tsinghua Univ, Beijing Natl Res Ctr Informat Sci & Technol, Beijing 100084, Peoples R China.
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2021; 56 (9): 2895