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A Self-Test Method of Structural Failures of Uncooled Infrared Focal Plane Array

Liu, C; Fu, JY; Hou, Y; Zhou, Q; Chen, DP

Fu, JY (corresponding author), Chinese Acad Sci, Inst Microelect, Key Lab Microelect Device & Integrated Technol, Beijing 100029, Peoples R China.

IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2021; 34 (3): 235

Abstract

Defective pixels always exist in an uncooled infrared focal plane array (IR FPA), and have a significant impact on image quality. To fundamentally red......

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