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Toward Purifying Defect Feature for Multilabel Sewer Defect Classification

Hu, CF; Dong, B; Shao, H; Zhang, JP; Wang, YX

Wang, YX (通讯作者),Univ Shanghai Sci & Technol, Sch Opt Elect & Comp Engn, Shanghai 200093, Peoples R China.

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023; 72 ():

Abstract

An automatic vision-based sewer inspection plays a key role of sewage system in a modern city. Recent advances focus on utilizing a deep learning mode......

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