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Defect Analysis and Parallel Testing or 3D Hybrid CMOS-Memristor Memory

Liu, P; You, ZQ; Wu, JG; Elimu, M; Wang, WZ; Cai, S; Han, YH

Wu, JG (corresponding author), Guangdong Univ Technol, Sch Comp, Guangzhou 510006, Peoples R China.; You, ZQ (corresponding author), Hunan Univ, Coll Comp Sci & Elect Engn, Key Lab Embedded & Network Comp Hunan Prov, Changsha 410082, Peoples R China.

IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING, 2021; 9 (2): 745

Abstract

CMOS Molecular (CMOL) architecture, which can alleviate the sneak path problem of one memristor (1R) crossbars and limit its power consumption, can be......

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