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DOVA PRO: A Dynamic Overwriting Voltage Adjustment Technique for STT-MRAM L1 Cache Considering Dielectric Breakdown Effect

Chen, JB; Lu, CC; Ni, JC; Guo, XC; Girard, P; Cheng, YQ

Cheng, YQ (corresponding author), Beihang Univ, Sch Integrated Circuit Sci & Engn, MIIT Key Lab Spintron, Beijing 100191, Peoples R China.

IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2021; 29 (7): 1325

Abstract

As device integration density increases exponentially as predicted by Moore's law, power consumption becomes a bottleneck for system scaling where lea......

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