GetPortalImpactFactorByIdResp(projectId=1, id=4acc2997, cover=https://img.medsci.cn/images/journal/cover/2021/FSb_202109271315152000.jpg, fullname=IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, abbr=IEEE T DEVICE MAT RE, pyear=暂无数据, frequence=Quarterly, articleNumbers=1174, citedSelf2015=11.3, acceptanceRate=null, submissionToAcceptance=null, averageReviewTime=暂无数据, reviewFee=null, pageFee=null, publishedRatio=2023年中国人文章占该期刊总数量暂无数据 (2022年为100.00%), issn=1530-4388, greenSci=https://www.greensci.net/search?kw=1530-4388, scijournal=https://www.scijournal.org/impact-factor-of-IEEE-T-DEVICE-MAT-RE.shtml, medsciHotlightString=null, medsciHotlightRealtime=2.283, medsciHotlight=1.913, medsciHotlight5year=2.64314, citescore=4.8, hIndex=70, impactFactor=2.0, orgnization=Institute of Electrical and Electronics Engineers Inc., orgnizationUrl=http://www.ieee.org, country=United States, countryCn=美国, isOa=0, isOaString=否, sciScie=Science Citation Index Expanded|Current Contents - Engineering, Computing & Technology, bigclassCas=工程技术 4区, smallclassCas=工程技术 4 区, website=http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7298, websiteHits=4372, guideForAuthor=null, guideForAuthorHits=1, submitWebsite=https://mc.manuscriptcentral.com/tdmr|https://mc.manuscriptcentral.com/tdmr, submitWebsiteHits=2135, content=Published by IEEE.
ISSN: 1530-4388.<br /><br />An on-line publication providing leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It will focus on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the manufacture of these devices; and the interfaces and surfaces of these materials. All issue topics are carefully chosen through the input of experienced professionals from both academic and industrial sectors. The manuscripts are passed through a special review process to ensure high technical content and that they are of interest to the special issue audience., totalCites=2349, brief=IEEE T DEVICE MAT RE杂志工程技术行业,“<strong><a target="_blank" href="/sci/index.do?smallclass=工程:电子与电气" >工程:电子与电气</a></strong>”子行业的中等级别杂志, articleType=绝大部分收录论著,也接收少量其它类型文章, medsciHeat=<span style="color: #000000;">黑</span>, medsciComment=杂志水平一般,也很冷门,关注人少,审稿周期可能也不一定快,如果文章质量不佳,或时间不紧的话,可以考虑考虑。, medsciExplanation=MedSci期刊指数是根据中国科研工作者(含医学临床,基础,生物,化学等学科)对SCI杂志的认知度,熟悉程度,以及投稿的量等众多指标综合评定而成。当然,具体的,您还可以结合“<a href='//m.capotfarm.com/sci/submit.do?id=4acc2997'>投稿经验系统</a>”,进行综合判断,这更是大家的实战经验,值得分享和参考。<br>
注意,上述MedSci期刊指数采用MedSci专利技术,由计算机系统自动计算,并给出建议,存在不准确的可能,仅供您投稿选择杂志时参考。, tags=null, citeScoreList=[GetImpactFactorCiteScoreListResponse(year=2017, citescore=1.99), GetImpactFactorCiteScoreListResponse(year=2018, citescore=37.26), GetImpactFactorCiteScoreListResponse(year=2019, citescore=3.3), GetImpactFactorCiteScoreListResponse(year=2020, citescore=3.5), GetImpactFactorCiteScoreListResponse(year=2023, citescore=4.8)], medsciIndexList=[GetImpactFactorMedsciIndexListResponse(year=2020, medsciHotlight=2.614), GetImpactFactorMedsciIndexListResponse(year=2021, medsciHotlight=1.618), GetImpactFactorMedsciIndexListResponse(year=2022, medsciHotlight=2.143), GetImpactFactorMedsciIndexListResponse(year=2023, medsciHotlight=3.23), GetImpactFactorMedsciIndexListResponse(year=2024, medsciHotlight=2.283)], citeScoreGradeList=[GetImpactFactorCiteScoreGradeResponse(smallClass=Engineering - Safety, Risk, Reliability and Quality , rank=50/154), GetImpactFactorCiteScoreGradeResponse(smallClass=Engineering - Electrical and Electronic Engineering , rank=239/661), GetImpactFactorCiteScoreGradeResponse(smallClass=Materials Science - Electronic, Optical and Magnetic Materials , rank=93/225)], totalJcrAreaList=[], pmcUrl=https://www.ncbi.nlm.nih.gov/nlmcatalog?term=1530-4388[ISSN], pubmedUrl=https://www.ncbi.nlm.nih.gov/pubmed?cmd=search&term=IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY[ta], article_number=58, article_number_cn=13, earlyWarning=null, linkOutUrl=null, isJournalMember=false, unscrambleContent=null, dayViewCount=false, endexampletyle=暂无数据)
期刊名称
IEEE T DEVICE MAT RE/IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY