GetPortalImpactFactorByIdResp(projectId=1, id=87f74883, cover=https://img.medsci.cn/images/journal/cover/2021/aoT_202109271316035860.jpg, fullname=MICROELECTRONICS RELIABILITY, abbr=MICROELECTRON RELIAB, pyear=1964, frequence=Monthly, articleNumbers=5408, citedSelf2015=18.6, acceptanceRate=null, submissionToAcceptance=null, averageReviewTime=暂无数据, reviewFee=null, pageFee=null, publishedRatio=2023年中国人文章占该期刊总数量暂无数据 (2022年为100.00%), issn=0026-2714, greenSci=https://www.greensci.net/search?kw=0026-2714, scijournal=https://www.scijournal.org/impact-factor-of-MICROELECTRON-RELIAB.shtml, medsciHotlightString=null, medsciHotlightRealtime=2.702, medsciHotlight=2.927, medsciHotlight5year=3.97129, citescore=3.3, hIndex=91, impactFactor=1.6, orgnization=Elsevier Ltd., orgnizationUrl=http://www.elsevier.com, country=Netherlands, countryCn=荷兰, isOa=0, isOaString=否, sciScie=Science Citation Index|Science Citation Index Expanded|Current Contents - Engineering, Computing &amp; Technology, bigclassCas=工程技术 4区, smallclassCas=工程技术 4 区, website=https://www.journals.elsevier.com/microelectronics-reliability/, websiteHits=4553, guideForAuthor=null, guideForAuthorHits=1, submitWebsite=https://www.editorialmanager.com/mr/, submitWebsiteHits=1622, content=Microelectronics Reliability is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems. The coverage of the journal includes the following topics: physics and analysis; evaluation and prediction; modelling and simulation; methodologies and assurance. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, packaging and testing, will also be welcome, and practical papers reporting case studies in the field are particularly encouraged.Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.Additional regular features will include: special issues devoted to significant international conferences, or to important developing topics letters to the Editors industrial news and updates calendar of forthcoming events book reviewsMicroelectronics Reliability is an indispensable forum for the exchange of knowledge and experience between microelectronics reliability professionals from both academic and industrial environments, and all those associated in any way with a steadily growing microelectronics industry and its many fields of application., totalCites=8654, brief=MICROELECTRON RELIAB杂志工程技术行业，“<strong><a target="_blank" href="/sci/index.do?smallclass=工程：电子与电气" >工程：电子与电气</a></strong>”子行业的偏低级别杂志, articleType=绝大部分收录论著，也接收少量其它类型文章, medsciHeat=<span style="color: #000000;">黑</span>, medsciComment=杂志水平一般，也很冷门，关注人少，审稿周期可能也不一定快，如果文章质量不佳，或时间不紧的话，可以考虑考虑。, medsciExplanation=MedSci期刊指数是根据中国科研工作者（含医学临床，基础，生物，化学等学科）对SCI杂志的认知度，熟悉程度，以及投稿的量等众多指标综合评定而成。当然，具体的，您还可以结合“<a href='//m.capotfarm.com/sci/submit.do?id=87f74883'>投稿经验系统</a>”，进行综合判断，这更是大家的实战经验，值得分享和参考。<br> 注意，上述MedSci期刊指数采用MedSci专利技术，由计算机系统自动计算，并给出建议，存在不准确的可能，仅供您投稿选择杂志时参考。, tags=null, citeScoreList=[GetImpactFactorCiteScoreListResponse(year=2017, citescore=1.52), GetImpactFactorCiteScoreListResponse(year=2018, citescore=1.7), GetImpactFactorCiteScoreListResponse(year=2019, citescore=3.1), GetImpactFactorCiteScoreListResponse(year=2020, citescore=3.6), GetImpactFactorCiteScoreListResponse(year=2023, citescore=3.3)], medsciIndexList=[GetImpactFactorMedsciIndexListResponse(year=2020, medsciHotlight=3.462), GetImpactFactorMedsciIndexListResponse(year=2021, medsciHotlight=3.204), GetImpactFactorMedsciIndexListResponse(year=2022, medsciHotlight=2.804), GetImpactFactorMedsciIndexListResponse(year=2023, medsciHotlight=2.828), GetImpactFactorMedsciIndexListResponse(year=2024, medsciHotlight=2.702)], citeScoreGradeList=[GetImpactFactorCiteScoreGradeResponse(smallClass=Engineering - Safety, Risk, Reliability and Quality , rank=54/154), GetImpactFactorCiteScoreGradeResponse(smallClass=Engineering - Electrical and Electronic Engineering , rank=248/661), GetImpactFactorCiteScoreGradeResponse(smallClass=Materials Science - Surfaces, Coatings and Films , rank=48/116), GetImpactFactorCiteScoreGradeResponse(smallClass=Physics and Astronomy - Condensed Matter Physics , rank=168/397), GetImpactFactorCiteScoreGradeResponse(smallClass=Materials Science -, rank=Materials Science -)], totalJcrAreaList=[GetImpactFactorCiteScoreGradeResponse(smallClass=ENGINEERING, ELECTRICAL & ELECTRONIC, rank=Q3), GetImpactFactorCiteScoreGradeResponse(smallClass=NANOSCIENCE & NANOTECHNOLOGY, rank=Q4), GetImpactFactorCiteScoreGradeResponse(smallClass=PHYSICS, APPLIED, rank=Q3)], pmcUrl=https://www.ncbi.nlm.nih.gov/nlmcatalog?term=0026-2714[ISSN], pubmedUrl=https://www.ncbi.nlm.nih.gov/pubmed?cmd=search&term=MICROELECTRONICS RELIABILITY[ta], article_number=318, article_number_cn=106, earlyWarning=null, linkOutUrl=null, isJournalMember=false, unscrambleContent=null, dayViewCount=false, endexampletyle=暂无数据)