GetPortalImpactFactorByIdResp(projectId=1, id=aa424795, cover=https://img.medsci.cn/images/journal/cover/2021/Hnr_202109271316036020.jpg, fullname=MICROELECTRONIC ENGINEERING, abbr=MICROELECTRON ENG, pyear=1983, frequence=Monthly, articleNumbers=3506, citedSelf2015=6.7, acceptanceRate=null, submissionToAcceptance=null, averageReviewTime=平均3月, reviewFee=null, pageFee=null, publishedRatio=2023年中国人文章占该期刊总数量暂无数据 (2022年为100.00%), issn=0167-9317, greenSci=https://www.greensci.net/search?kw=0167-9317, scijournal=https://www.scijournal.org/impact-factor-of-MICROELECTRON-ENG.shtml, medsciHotlightString=null, medsciHotlightRealtime=2.609, medsciHotlight=2.488, medsciHotlight5year=3.48697, citescore=5.3, hIndex=99, impactFactor=2.3, orgnization=Elsevier, orgnizationUrl=http://www.elsevier.com, country=Netherlands, countryCn=荷兰, isOa=0, isOaString=否, sciScie=Science Citation Index|Science Citation Index Expanded|Current Contents - Engineering, Computing &amp; Technology, bigclassCas=工程技术 3区, smallclassCas=工程技术 4 区, website=https://www.journals.elsevier.com/microelectronic-engineering/, websiteHits=4148, guideForAuthor=null, guideForAuthorHits=1, submitWebsite=https://www.editorialmanager.com/mee|https://www.editorialmanager.com/mee, submitWebsiteHits=2138, content=The aim of Microelectronic Engineering is to bring together in one publication the results of European, American and Japanese work in the rapidly expanding field of integrated microelectronic, optic and optoelectronic devices. Microelectronic Engineering is an archival, peer-reviewed journal. It publishes full research papers, short communications, and review articles. The scope of this Journal includes materials, methods and designs for microfabrication, processing and inspection for microelectronic and optoelectronic elements from centimeters to nanometers.The wide range of topics covered by the journal include:1. Lithographyoptical lithography (submicron dimensions, deep u.v. lithography)electron optical methods and systemsX-ray optical methods and systemsresistslimits2. Pattern Transferion technologyplasma etchingself-organisation3. Materialsmetallization and barrier materialsmicrostructuring growth processessilicon on insulatorscompound semiconductorsdielectrics (low K and high K)interconnect architectures4. Inspection and Testingelectron beam testerslaser probessignal and image processingmetrology5. Advanced Processingprocess integrationthree dimensional integrationdefect free processesmanufacturing sciencerapid thermal processingprocess modellingequipment modellinglaser assisted processing6. Micromechanical Structuresfabricationdesign7. Advanced Devicesnanometer structuresdimension-sensitive device propertieseffect of scaling LDSD 99 - The Third International Conference on Low Dimensional Structures and Devices LDSD 99 - The Third International Conference on Low Dimensional Structures and Devices will take place 15-17 September 1999 in Antalya, Turkey. For full details see the conference website or contact Sue Stewart, e-mail: suestewart@compuserve.com at the conference secretariat., totalCites=8065, brief=MICROELECTRON ENG杂志工程技术行业，“<strong><a target="_blank" href="/sci/index.do?smallclass=工程：电子与电气" >工程：电子与电气</a></strong>”子行业的中等级别杂志, articleType=论著为主，其它类型文章约占5-10%, medsciHeat=<span style="color: #990000;">暗红</span>, medsciComment=MICROELECTRON ENG杂志级别还可以，但是相对来说，比较冷门，关注人数偏少，有些可能是国内不太熟悉，但该杂志在国际仍然有相当知晓度的。因为缺少中国人投稿，稿源可能未必丰富，发表有可能有很大的机会哦。, medsciExplanation=MedSci期刊指数是根据中国科研工作者（含医学临床，基础，生物，化学等学科）对SCI杂志的认知度，熟悉程度，以及投稿的量等众多指标综合评定而成。当然，具体的，您还可以结合“<a href='//m.capotfarm.com/sci/submit.do?id=aa424795'>投稿经验系统</a>”，进行综合判断，这更是大家的实战经验，值得分享和参考。<br> 注意，上述MedSci期刊指数采用MedSci专利技术，由计算机系统自动计算，并给出建议，存在不准确的可能，仅供您投稿选择杂志时参考。, tags=[ImpactFactorTagDto(id=41665, tagName=磁学, createdHits=1), ImpactFactorTagDto(id=42167, tagName=电子工程, createdHits=1), ImpactFactorTagDto(id=49846, tagName=微纳技术, createdHits=1), ImpactFactorTagDto(id=9314, tagName=光学, createdHits=1), ImpactFactorTagDto(id=114536, tagName=微电子, createdHits=1)], citeScoreList=[GetImpactFactorCiteScoreListResponse(year=2017, citescore=1.87), GetImpactFactorCiteScoreListResponse(year=2018, citescore=1.91), GetImpactFactorCiteScoreListResponse(year=2019, citescore=3.9), GetImpactFactorCiteScoreListResponse(year=2020, citescore=4.5), GetImpactFactorCiteScoreListResponse(year=2023, citescore=5.3)], medsciIndexList=[GetImpactFactorMedsciIndexListResponse(year=2020, medsciHotlight=2.537), GetImpactFactorMedsciIndexListResponse(year=2021, medsciHotlight=2.195), GetImpactFactorMedsciIndexListResponse(year=2022, medsciHotlight=2.467), GetImpactFactorMedsciIndexListResponse(year=2023, medsciHotlight=3.194), GetImpactFactorMedsciIndexListResponse(year=2024, medsciHotlight=2.609)], citeScoreGradeList=[GetImpactFactorCiteScoreGradeResponse(smallClass=Engineering - Electrical and Electronic Engineering , rank=220/661), GetImpactFactorCiteScoreGradeResponse(smallClass=Materials Science - Surfaces, Coatings and Films , rank=40/116), GetImpactFactorCiteScoreGradeResponse(smallClass=Physics and Astronomy - Condensed Matter Physics , rank=146/397), GetImpactFactorCiteScoreGradeResponse(smallClass=Materials Science - Electronic, Optical and Magnetic Materials , rank=84/225), GetImpactFactorCiteScoreGradeResponse(smallClass=Physics , rank=Physics )], totalJcrAreaList=[GetImpactFactorCiteScoreGradeResponse(smallClass=ENGINEERING, ELECTRICAL & ELECTRONIC, rank=Q2), GetImpactFactorCiteScoreGradeResponse(smallClass=NANOSCIENCE & NANOTECHNOLOGY, rank=Q3), GetImpactFactorCiteScoreGradeResponse(smallClass=OPTICS, rank=Q3), GetImpactFactorCiteScoreGradeResponse(smallClass=PHYSICS, APPLIED, rank=Q3)], pmcUrl=https://www.ncbi.nlm.nih.gov/nlmcatalog?term=0167-9317[ISSN], pubmedUrl=https://www.ncbi.nlm.nih.gov/pubmed?cmd=search&term=MICROELECTRONIC ENGINEERING[ta], article_number=130, article_number_cn=34, earlyWarning=null, linkOutUrl=null, isJournalMember=false, unscrambleContent=null, dayViewCount=false, endexampletyle=暂无数据)