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Engineering application research on reliability prediction of the combined DC-DC power supply

He, YC; Zhang, HM; Wang, PZ; Huang, YZ; Chen, ZW; Zhang, YY

Zhang, YY (corresponding author), Hefei Univ Technol, Sch Elect Engn & Automat, Hefei 230009, Anhui, Peoples R China.

MICROELECTRONICS RELIABILITY, 2021; 118 ():

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