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Reliability assessment on 16 nm ultrascale plus MPSoC using fault injection and fault tree analysis

Yang, WT; Du, BY; He, CH; Sterpone, L

He, CH (corresponding author), Xi An Jiao Tong Univ, Sch Nucl Sci & Technol, Xian, Peoples R China.; Du, BY (corresponding author), Politecn Torino, Dipartimento Automat & Informat, Turin, Italy.

MICROELECTRONICS RELIABILITY, 2021; 120 ():

Abstract

A methodology is proposed to emulate and assess the single event effect in configuration memory on 16 nm Ultrascale+ MPSoC. The solution depends on fa......

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