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Analog/Radio-Frequency Performance Analysis of Nanometer Negative Capacitance Fully Depleted Silicon-On-Insulator Transistors

Si, P; Zhang, K; Yu, TY; Zhao, ZF; Lu, WF

Lu, WF (corresponding author), Hangzhou Dianzi Univ, Key Lab RF Circuits & Syst, Minist Educ, Hangzhou, Peoples R China.

INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, 2020; 50 (1): 47

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