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A novel optimal accelerated degradation test design method considering multiple decision variables

Wang, ZH; Liu, G; Li, WB; Wu, Q; Li, JX; Liu, CR

Wang, ZH (corresponding author), Beihang Univ, Sch Aeronaut Sci & Engn, Beijing 100191, Peoples R China.

MICROELECTRONICS RELIABILITY, 2021; 124 ():

Abstract

In recent years, there has been considerable interest on the part of scientist and engineers in effectively designing accelerated degradation test, wh......

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