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Analyzing and increasing soft error resilience of Deep Neural Networks on ARM processors

Liu, Z; Liu, YH; Chen, ZM; Guo, G; Wang, HB

Wang, HB (corresponding author), Hohai Univ, Informat Div, Nanjing 210098, Jiangsu, Peoples R China.; Wang, HB (corresponding author), Beijing Microelect Technol Inst, Beijing 100076, Peoples R China.

MICROELECTRONICS RELIABILITY, 2021; 124 ():

Abstract

Deep Neural Networks (DNNs) have been successfully deployed in safety-critical applications due to the capability of computing in complex tasks. Becau......

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