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Reliable and Radiation-Hardened Push-Pull pFlash Cell for Reconfigured FPGAs

Liu, GZ; Yu, ZG; Xiao, ZQ; Wei, JH; Li, B; Cao, LC; Song, SD; Zhao, W; Sun, JH; Wang, HB

Liu, GZ (corresponding author), China Elect Technology Grp Corp 58, Res Inst, Key Lab Radiat Hardened Integrated Circuit, Wuxi 214035, Jiangsu, Peoples R China.

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2021; 21 (1): 87

Abstract

The base component of radiation-hardened flash-based field-programmable gate arrays (FPGAs) is a reconfigurable memory cell, which is reliable and has......

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