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Temperature dependence of the electrical characteristics of ZnO thin film transistor with high-k NbLaO gate dielectric

Li, HC; Liu, YR; Geng, KW; Wu, WJ; Yao, RH; Lai, PT

Liu, YR (corresponding author), South China Univ Technol, Sch Microelect, Guangzhou 510640, Peoples R China.

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2021; 39 (1):

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