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Prediction of IGBT junction temperature using improved cuckoo search-based extreme learning machine

Liu, BY; Chen, GL; Lin, HC; Zhang, WP; Liu, JQ

Lin, HC (corresponding author), Natl Chin Yi Univ Technol, Dept Elect Engn, Taichung 41170, Taiwan.

MICROELECTRONICS RELIABILITY, 2021; 124 ():

Abstract

The insulated-gate bipolar transistor (IGBT) is one of the most widely used power transistors in switching and industrial control systems. Its actual ......

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